X-ray Diffraction and Unit Cell Parameters
X-ray diffraction is a technique used to determine the atomic structure of a crystal by measuring the angles and intensities of scattered X-rays. The edge length of the unit cell, measured as 350.7 pm (picometers), is essential for calculating the volume of the unit cell and subsequently the number of atoms it contains. This information, combined with density, allows for the determination of atomic weight and the identity of the metal.